Improved de-embedding technique for polysilicon resistor modelling

Author: Han Bo  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.100, Iss.5, 2013-05, pp. : 637-647

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract