![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Liu Wei-Dong
Publisher: Taylor & Francis Ltd
ISSN: 1362-3060
Source: International Journal of Electronics, Vol.80, Iss.1, 1996-01, pp. : 47-55
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Pey K.L. Tung C.H. Radhakrishnan M.K. Tang L.J. Sun Y. Wang X.D. Lin W.H.
Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Jin Xiaoshi Liu Xi Wu Meile Chuai Rongyan Lee Jung-Hee Lee Jong-Ho
Semiconductor Science and Technology, Vol. 28, Iss. 1, 2013-01 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)