Microelectronics Reliability

Publisher: Elsevier

Founded in: 1962

Total resources: 4

E-ISSN: 1872-941X

ISSN: 0026-2714

Subject:

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Microelectronics Reliability

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Reliability testing of flexible printed circuit-based RF MEMS capacitive switches

By Lee S., Ramadoss R., Buck M., Bright V.M., Gupta K.C., Lee Y.C. in (2004)

Microelectronics Reliability , Vol. 44, Iss. 2, 2004-02 , pp. 245-250

Elsevier

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Design optimization of ESD protection and latchup prevention for a serial I/O IC

By Huang C.-Y., Chen W.-F., Chuan S.-Y., Chiu F.-C., Tseng J.-C., Lin I.-C., Chao C.-J., Leu L.-Y., Ker M.-D. in (2004)

Microelectronics Reliability , Vol. 44, Iss. 2, 2004-02 , pp. 213-221

Elsevier

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