Correlation between electric force microscopy and scanning electron microscopy for the characterization of percolative conduction in electronic devices

Author： Alessandrini A.   Valdre G.   Morten B.   Piccinini S.   Prudenziati M.  

Publisher： Taylor & Francis Ltd

ISSN： 1463-6417

Source： Philosophical Magazine B, Vol.79, Iss.3, 1999-03, pp. : 517-526

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Characterization of electronic materials and devices by scanning near-field microscopy

By Balk L.J.   Heiderhoff R.   Phang J.C.H.   Thomas Ch.  

Applied Physics A, Vol. 87, Iss. 3, 2007-06 ,pp. : 443-449

Springer Publishing Company

Access to resources Recommend Favorite

Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy

By Fruhstorfer B.   Mohles V.   Reichelt R.   Nembach E.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 13, 2002-09 ,pp. : 2575-2589

Taylor & Francis Ltd

Access to resources Recommend Favorite

Membrane characterization by means of pneumatic scanning force microscopy

By Kamusewitz H.   Keller M.   Paul D.  

Thin Solid Films, Vol. 264, Iss. 2, 1995-08 ,pp. : 184-193

Elsevier

Access to resources Recommend Favorite

Nanoindentation and scanning force microscopy as a novel method for the characterization of tribological transfer films

By Randall N.X.   Bozet J.L.  

Wear, Vol. 212, Iss. 1, 1997-11 ,pp. : 18-24

Elsevier

Access to resources Recommend Favorite

Scanning force microscopy application to polymer surfaces for novel nanoscale surface characterization

By Motomatsu M.   Nie H.-Y.   Mizutani W.   Tokumoto H.  

Thin Solid Films, Vol. 273, Iss. 1, 1996-02 ,pp. : 304-307

Elsevier

Access to resources Recommend Favorite