Comparison of atomic force microscopy and transmission electron microscopy of second-phase particles

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Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 81, Iss. 11, 2001-11 ,pp. : 2613-2628

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Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

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Philosophical Magazine, Vol. 87, Iss. 16-17, 2007-01 ,pp. : 2427-2460

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Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

By Sobchenko I.  

Philosophical Magazine, Vol. 87, Iss. 17, 2007-01 ,pp. : 2427-2460

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Antibacterial action of lipidic nanoemulsions using atomic force microscopy and scanning electron microscopy on Escherichia coli

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Journal of Experimental Nanoscience, Vol. 10, Iss. 5, 2015-03 ,pp. : 381-391

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Correlation between electric force microscopy and scanning electron microscopy for the characterization of percolative conduction in electronic devices

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