High-speed TFT LCD defect-detection system with genetic algorithm

Author: Lin Chern-Sheng   Liao Yo-Chang   Lay Yun-Long   Lee Kun-Chen   Yeh Mau-Shiun  

Publisher: Emerald Group Publishing Ltd

ISSN: 0144-5154

Source: Assembly Automation, Vol.28, Iss.1, 2008-02, pp. : 69-76

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Abstract