Genetic algorithm based defect identification system

Author: Sadegh-Zadeh K.   Tam S.M.   Cheung K.C.  

Publisher: Elsevier

ISSN: 0957-4174

Source: Expert Systems with Applications, Vol.18, Iss.1, 2000-01, pp. : 17-25

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract