Author： Napieralski Andrzej Napieralska Malgorzata Szermer Michal Maj Cezary
Publisher： Emerald Group Publishing Ltd
ISSN： 0332-1649
Source： COMPEL: Int J for Computation and Maths. in Electrical and Electronic Eng., Vol.31, Iss.5, 2012-09, pp. : 1458-1469
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
Assessment of testing methodologies for thin-film vacuum MEMS packages
By Li Qian
Microsystem Technologies, Vol. 15, Iss. 1, 2009-01 ,pp. :
By Kimmance A.G. Anumba C.J. Bouchlaghem D.M. Baldwin A.N.
International Journal of Computer Applications in Technology, Vol. 20, Iss. 1-2, 2004-05 ,pp. :