Force Curve Measurements with the AFM: Application to the In Situ Determination of Grafted Silicon-Wafer Surface Energies

Author： Noel Olivier Awada Houssein Castelein Gilles Brogly Maurice Schultz Jacques

Publisher： Taylor & Francis Ltd

ISSN： 0021-8464

Source： Journal of Adhesion, Vol.82, Iss.7, 2006-06, pp. : 649-669

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Maximum Force Technique for the Measurement of the Surface Tension of a Small Droplet by AFM

By McGuiggan Patricia Wallace Jay

Journal of Adhesion, Vol. 82, Iss. 10, 2006-10 ,pp. : 997-1011

Taylor & Francis Ltd

Access to resources Recommend Favorite

Adsorption and Desorption of Cetyl Pyridinium Ions at a Tungsten-Coated Silicon Wafer Surface

By Free M.L. Shah D.O.

Journal of Colloid and Interface Science, Vol. 208, Iss. 1, 1998-12 ,pp. : 104-109

Academic Press

Access to resources Recommend Favorite

Effect of oxidized silicon surface on chemical deposition of nickel on n-type silicon wafer

By Takano N. Hosoda N. Yamada T. Osaka T.

Electrochimica Acta, Vol. 44, Iss. 21, 1999-06 ,pp. : 3743-3749

Elsevier

Access to resources Recommend Favorite

The study of lithium insertion-deinsertion processes into composite graphite electrodes by in situ atomic force microscopy (AFM)

By Koltypin M. Cohen Y.S. Markovsky B. Cohen Y. Aurbach D.

Electrochemistry Communications, Vol. 4, Iss. 1, 2002-01 ,pp. : 17-23

Elsevier

Access to resources Recommend Favorite

In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope

By González-Jorge Higinio Alvarez-Valado Victor Valencia Jose Luis Torres Soledad

Sensors, Vol. 10, Iss. 4, 2010-04 ,pp. : 4002-4009

MDPI

Access to resources Recommend Favorite