In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope

Author： González-Jorge Higinio   Alvarez-Valado Victor   Valencia Jose Luis   Torres Soledad  

Publisher： MDPI

E-ISSN： 1424-8220|10|4|4002-4009

ISSN： 1424-8220

Source： Sensors, Vol.10, Iss.4, 2010-04, pp. : 4002-4009

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