Compact modeling of the threshold voltage in silicon nanowire MOSFET including 2D-quantum confinement effects

Author: Autran J. L.   Nehari K.   Munteanu D.  

Publisher: Taylor & Francis Ltd

ISSN: 0892-7022

Source: Molecular Simulation, Vol.31, Iss.12, 2005-10, pp. : 839-843

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Abstract