Practical Performance of Energy-Dispersive X-Ray Spectroscopy with a High-Voltage TEM up to 1,000 kV

By Furuya Kazuo   Osaki Mitsuaki   Awaji Mitsuhiro   Saito Tetsuya  

Journal of Electron Microscopy, Vol. 45, Iss. 4, 1996-08 ,pp. : 285-290

Oxford University Press

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STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

By Sawada Hidetaka   Tanishiro Yasumasa   Ohashi Nobuhiro   Tomita Takeshi   Hosokawa Fumio   Kaneyama Toshikatsu   Kondo Yukihito   Takayanagi Kunio  

Journal of Electron Microscopy, Vol. 58, Iss. 6, 2009-12 ,pp. : 357-361

Oxford University Press

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Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10 kV and 40 kV

By Kamino Takeo  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 459-463

Oxford University Press

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A spherical aberration‐corrected 200 kV TEM

By Hosokawa* Fumio  

Journal of Electron Microscopy, Vol. 52, Iss. 1, 2003-03 ,pp. : 3-10

Oxford University Press

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Elemental mapping of DNA chains by energy-filtering TEM

By Aoyama K.  

Journal of Electron Microscopy, Vol. 52, Iss. 3, 2003-06 ,pp. : 283-289

Oxford University Press

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