STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

Author: Sawada Hidetaka   Tanishiro Yasumasa   Ohashi Nobuhiro   Tomita Takeshi   Hosokawa Fumio   Kaneyama Toshikatsu   Kondo Yukihito   Takayanagi Kunio  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.58, Iss.6, 2009-12, pp. : 357-361

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