First observation of SiO 2 /Si(100) interfaces by spherical aberration‐corrected high‐resolution transmission electron microscopy

By Tanaka* Nobuo  

Journal of Electron Microscopy, Vol. 52, Iss. 1, 2003-03 ,pp. : 69-73

Oxford University Press

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High-resolution transmission electron microscopy and electron energy-loss spectroscopy study of polycrystalline-Si/ZrO 2 /SiO 2 /Si metal-oxide-semiconductor structures

By Yang Jun-Mo   Kim Joong Jung   Kim Kyung-Seob   Lee Wan-Gyu   Kawasaki Masahiro  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 1-5

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Time-Resolved High-Resolution Electron Microscopy of Surface-Diffusion of Tungsten Atoms on MgO (001) Surfaces

By Tanaka Nobuo   Kimata Hideaki   Kizuka Tokushi  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 113-118

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Note. Quantitative analysis of a high-resolution electron microscopy image of WO 3 block structure with a residual index

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Journal of Electron Microscopy, Vol. 46, Iss. 6, 1998-01 ,pp. : 473-476

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A New Cubic B-C-N Compound Revealed by High-Resolution Analytical Electron Microscopy

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Journal of Electron Microscopy, Vol. 45, Iss. 2, 1996-04 ,pp. : 135-142

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