electron microscopy, scanning transmission, thin annular detectors, nanodiffraction, nanocrystals

Author： Cowley M  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.50, Iss.3, 2001-05, pp. : 147-155

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Annular dark-field scanning transmission electron microscopy (ADF-STEM) tomography of polymer systems

By Lu Kangbo   Sourty Erwan   Loos Joachim  

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 531-531

Oxford University Press

Access to resources Recommend Favorite

High-resolution low-dose scanning transmission electron microscopy

By Buban James P.   Ramasse Quentin   Gipson Bryant   Browning Nigel D.   Stahlberg Henning  

Journal of Electron Microscopy, Vol. 59, Iss. 2, 2010-04 ,pp. : 103-112

Oxford University Press

Access to resources Recommend Favorite

Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems

By Liu Jingyue  

Journal of Electron Microscopy, Vol. 54, Iss. 3, 2005-06 ,pp. : 251-278

Oxford University Press

Access to resources Recommend Favorite

New area detector for atomic-resolution scanning transmission electron microscopy

By Shibata Naoya   Kohno Yuji   Findlay Scott D.   Sawada Hidetaka   Kondo Yukihito   Ikuhara Yuichi  

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 473-479

Oxford University Press

Access to resources Recommend Favorite

Microstructural characteristics of thin biofilms through optical and scanning electron microscopy

By Cortizo M.C.  

World Journal of Microbiology and Biotechnology, Vol. 19, Iss. 8, 2003-11 ,pp. : 805-810

Springer Publishing Company

Access to resources Recommend Favorite