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Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 187-195

Oxford University Press

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high resolution electron microscopy, scanning transmission electron microscopy, spherical aberration, aberration correction, Ronchigram analysis

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Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 177-185

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A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy

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