First observation of SiO 2 /Si(100) interfaces by spherical aberration‐corrected high‐resolution transmission electron microscopy

By Tanaka* Nobuo  

Journal of Electron Microscopy, Vol. 52, Iss. 1, 2003-03 ,pp. : 69-73

Oxford University Press

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Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy

By Taya Masaki   Kawasaki Tadahiro   Takai Yoshizo  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 27-30

Oxford University Press

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High-resolution low-dose scanning transmission electron microscopy

By Buban James P.   Ramasse Quentin   Gipson Bryant   Browning Nigel D.   Stahlberg Henning  

Journal of Electron Microscopy, Vol. 59, Iss. 2, 2010-04 ,pp. : 103-112

Oxford University Press

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In situ observation of Pt nanoparticles on graphene layers under high temperature using aberration-corrected transmission electron microscopy

By Hashimoto Ayako   Takeguchi Masaki  

Journal of Electron Microscopy, Vol. 61, Iss. 6, 2012-12 ,pp. : 409-413

Oxford University Press

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Direct imaging of lithium atoms in LiV 2 O 4 by spherical aberration-corrected electron microscopy

By Oshima Yoshifumi   Sawada Hidetaka   Hosokawa Fumio   Okunishi Eiji   Kaneyama Toshikatsu   Kondo Yukihito   Niitaka Seiji   Takagi Hidenori   Tanishiro Yasumasa   Takayanagi Kunio  

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 457-461

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