First observation of SiO 2 /Si(100) interfaces by spherical aberration‐corrected high‐resolution transmission electron microscopy

By Tanaka* Nobuo  

Journal of Electron Microscopy, Vol. 52, Iss. 1, 2003-03 ,pp. : 69-73

Oxford University Press

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Depth sectioning of aligned crystals with the aberration-corrected scanning transmission electron microscope

By Borisevich Albina Y.   Lupini Andrew R.   Travaglini Samuel   Pennycook Stephen J.  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 7-12

Oxford University Press

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high resolution electron microscopy, scanning transmission electron microscopy, spherical aberration, aberration correction, Ronchigram analysis

By Dellby N   Krivanek L  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 177-185

Oxford University Press

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Direct imaging of lithium atoms in LiV 2 O 4 by spherical aberration-corrected electron microscopy

By Oshima Yoshifumi   Sawada Hidetaka   Hosokawa Fumio   Okunishi Eiji   Kaneyama Toshikatsu   Kondo Yukihito   Niitaka Seiji   Takagi Hidenori   Tanishiro Yasumasa   Takayanagi Kunio  

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 457-461

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In situ high temperature TEM observation of interaction between multi-walled carbon nanotube and in situ deposited gold nano-particles

By Kamino Takeo   Yaguchi Toshie   Konno Mitsuru   Hashimoto Takahito  

Journal of Electron Microscopy, Vol. 54, Iss. 5, 2005-10 ,pp. : 461-465

Oxford University Press

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