Application of Nano-Diffraction to Local Structure Analysis of Amorphous Pd 75 Si 25 Alloy Thin Films

By Matsushita Mitsuhide   Hirotsu Yoshihiko   Ohkubo Tadakatsu   Oikawa Tetsuo  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 105-112

Oxford University Press

Access to resources Recommend Favorite

First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM

By Yamasaki Jun  

Journal of Electron Microscopy, Vol. 54, Iss. 2, 2005-04 ,pp. : 123-126

Oxford University Press

Access to resources Recommend Favorite

Electron Nanodiffraction: Progress and Prospects

By Cowley J. M.  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 3-10

Oxford University Press

Access to resources Recommend Favorite

Fibre width measurement and quantification of filler size distribution in paper-based materials by SEM and image analysis

By Bennis Hamid   Benslimane Rachid   Vicini Silvia   Mairani Angelita   Princi Elisabetta  

Journal of Electron Microscopy, Vol. 59, Iss. 2, 2010-04 ,pp. : 91-102

Oxford University Press

Access to resources Recommend Favorite

New Trends in STEM-Based Nano-EELS Analysis

By Colliex Christian  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 44-50

Oxford University Press

Access to resources Recommend Favorite