Application of Nano-Diffraction to Local Structure Analysis of Amorphous Pd 75 Si 25 Alloy Thin Films

Author： Matsushita Mitsuhide   Hirotsu Yoshihiko   Ohkubo Tadakatsu   Oikawa Tetsuo  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.45, Iss.1, 1996-02, pp. : 105-112

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Application of nano-diffraction to local atomic distribution function analysis of amorphous materials

By Hirotsu Y.  

Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 435-442

Oxford University Press

Access to resources Recommend Favorite

Characterization of Co 25 Ag 75 and (Co 90 Al 10 ) 28 Ag 72 granular films by electron diffraction, high-resolution transmission electron microscopy and electron spectroscopic imaging

By Öksüzoglu1 *- R.M.   Weirich T.E.   Fuess H.  

Journal of Electron Microscopy, Vol. 52, Iss. 2, 2003-05 ,pp. : 91-100

Oxford University Press

Access to resources Recommend Favorite

First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM

By Yamasaki Jun  

Journal of Electron Microscopy, Vol. 54, Iss. 2, 2005-04 ,pp. : 123-126

Oxford University Press

Access to resources Recommend Favorite

electron microscopy, scanning transmission, thin annular detectors, nanodiffraction, nanocrystals

By Cowley M  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 147-155

Oxford University Press

Access to resources Recommend Favorite

Microstructural analysis of the deformation range under nano-indentation in -SiC

By Kishimoto Hirotatsu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 515-517

Oxford University Press

Access to resources Recommend Favorite