Application of electron holography to the determination of contact potential difference in an AlGaN/AlN/Si heterostructure

By Tanaka Shigeyasu   Naito Akiyuki   Honda Yoshio   Sawaki Nobuhiko   Ichihashi Mikio  

Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 37-42

Oxford University Press

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Electron-Beam-Induced-Current Investigation of GaN/AlGaN/Si Heterostructures Using Scanning Transmission Electron Microscopy

By Tanaka Shigeyasu   Aoyama Kentaro   Ichihashi Mikio   Arai Shigeo   Honda Yoshio   Sawaki Nobuhiko  

Journal of Electron Microscopy, Vol. 56, Iss. 4, 2007-08 ,pp. : 141-144

Oxford University Press

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Analysis of contacts and V-defects in GaN device structures by transmission electron microscopy

By Bright A.N.   Sharma N.   Humphreys C.J.  

Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 489-495

Oxford University Press

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Electron Holography of Electrostatic Fields

By Matteucci Giorgio   Missiroli Gian Franco   Pozzi Giulio  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 27-35

Oxford University Press

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Examination of electrostatic potential distribution across an implanted p–n junction by electron holography

By Wang Z.  

Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 479-484

Oxford University Press

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