Application of electron holography to the determination of contact potential difference in an AlGaN/AlN/Si heterostructure

Author： Tanaka Shigeyasu Naito Akiyuki Honda Yoshio Sawaki Nobuhiko Ichihashi Mikio

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.56, Iss.2, 2007-04, pp. : 37-42

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