Measurement of the repeat period of myelin sheath using ultrathin frozen sections

Author: Osawa T.   Ishida2 K.   Onodera1 M.   Feng1 X-Y.   Hayashi2 S.   Nozaka1 Y.  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.51, Iss.3, 2002-05, pp. : 195-197

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