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Author: Yoshino1 Tomoyuki Sugiyama1 Shigeru Hagiwara1 Shoji Ushiki2 Tatsuo Ohtani Toshio
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.51, Iss.3, 2002-05, pp. : 199-203
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Abstract
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