HREM study of ion implantation in 6H-SiC at high temperatures

By van Tendeloo G.  

Journal of Electron Microscopy, Vol. 46, Iss. 4, 1997-01 ,pp. : 271-279

Oxford University Press

Access to resources Recommend Favorite

In situ SEM micro-indentation of single wood pulp fibres in transverse direction

By Adusumalli Ramesh-Babu   Raghavan Rejin   Schwaller Patrick   Zimmermann Tanja   Michler Johann  

Journal of Electron Microscopy, Vol. 59, Iss. 5, 2010-10 ,pp. : 345-349

Oxford University Press

Access to resources Recommend Favorite

In situ electrical measurements and manipulation of B/N-doped C nanotubes in a high-resolution transmission electron microscope

By Golberg* D.   Mitome M.   Kurashima K.   Bando Y.  

Journal of Electron Microscopy, Vol. 52, Iss. 2, 2003-05 ,pp. : 111-117

Oxford University Press

Access to resources Recommend Favorite

Letter. High-definition image processing system for FE-SEM

By Yamada M.   Yoshihara T.   Arima H.   Kobayashi T.  

Journal of Electron Microscopy, Vol. 46, Iss. 4, 1997-01 ,pp. : 311-314

Oxford University Press

Access to resources Recommend Favorite

High-resolution spin-polarized scanning electron microscopy (spin SEM)

By Kohashi Teruo   Konoto Makoto   Koike Kazuyuki  

Journal of Electron Microscopy, Vol. 59, Iss. 1, 2010-02 ,pp. : 43-52

Oxford University Press

Access to resources Recommend Favorite