In situ electrical measurements and manipulation of B/N-doped C nanotubes in a high-resolution transmission electron microscope

Author: Golberg* D.   Mitome M.   Kurashima K.   Bando Y.  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.52, Iss.2, 2003-05, pp. : 111-117

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