A practical method for the remote control of the scanning electron microscope

Author： Yamada1 *- Atsushi   Hirahara1 Osamu   Tsuchida2 Takayoshi   Sugano2 Naoki   Date1 Masaru  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.52, Iss.2, 2003-05, pp. : 101-109

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