Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in STEM

By Xin Huolin L.   Muller David A.  

Journal of Electron Microscopy, Vol. 58, Iss. 3, 2009-06 ,pp. : 157-165

Oxford University Press

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In situ observation of Pt nanoparticles on graphene layers under high temperature using aberration-corrected transmission electron microscopy

By Hashimoto Ayako   Takeguchi Masaki  

Journal of Electron Microscopy, Vol. 61, Iss. 6, 2012-12 ,pp. : 409-413

Oxford University Press

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First observation of SiO 2 /Si(100) interfaces by spherical aberration‐corrected high‐resolution transmission electron microscopy

By Tanaka* Nobuo  

Journal of Electron Microscopy, Vol. 52, Iss. 1, 2003-03 ,pp. : 69-73

Oxford University Press

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STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

By Sawada Hidetaka   Tanishiro Yasumasa   Ohashi Nobuhiro   Tomita Takeshi   Hosokawa Fumio   Kaneyama Toshikatsu   Kondo Yukihito   Takayanagi Kunio  

Journal of Electron Microscopy, Vol. 58, Iss. 6, 2009-12 ,pp. : 357-361

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high resolution electron microscopy, scanning transmission electron microscopy, spherical aberration, aberration correction, Ronchigram analysis

By Dellby N   Krivanek L  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 177-185

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