Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy

By Ishitani Tohru   Kamiya Chisato   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 54, Iss. 2, 2005-04 ,pp. : 85-97

Oxford University Press

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Contrast-to-gradient method for the evaluation of image resolution in scanning electron microscopy

By Ishitani T.   Sato M.  

Journal of Electron Microscopy, Vol. 51, Iss. 6, 2002-11 ,pp. : 369-382

Oxford University Press

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Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy

By Ishitani Tohru   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 55, Iss. 5, 2006-10 ,pp. : 253-260

Oxford University Press

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Evaluation of both image resolution and contrast-to-noise ratio in scanning electron microscopy

By Ishitani Tohru   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 56, Iss. 4, 2007-08 ,pp. : 145-151

Oxford University Press

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atomic-resolution Z-contrast scanning transmission electron microscopy, icosahedral quasicrystals, intermetallic compound

By Abe E   Takakura H   Tsai AP  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 187-195

Oxford University Press

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