Journal of Electron Microscopy,volume 53,issue 3  (06-2013)

Period of time： 2013年3期

Publisher： Oxford University Press

Founded in： 1953

Total resources： 76

ISSN： 0022-0744

Subject： Q93 Microbiology

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Journal of Electron Microscopy,volume 53,issue 3

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Development of coincidence transmission electron microscope. III. Incorporation with -type imaging energy filter

By Nishinaka Kenichi,Taka Shinsuke,Kimura Yoshihide,Takai Yoshizo in (2004)

Journal of Electron Microscopy,volume 53,issue 3 , Vol. 53, Iss. 3, 2004-06 , pp. 217-222

Oxford University Press

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Observation of iron silicide formation by plan-view transmission electron microscopy

By Igarashi Shinichi in (2004)

Journal of Electron Microscopy,volume 53,issue 3 , Vol. 53, Iss. 3, 2004-06 , pp. 223-228

Oxford University Press

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Monte Carlo simulation of topographic contrast in scanning ion microscope

By Ohya Kaoru in (2004)

Journal of Electron Microscopy,volume 53,issue 3 , Vol. 53, Iss. 3, 2004-06 , pp. 229-235

Oxford University Press

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The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination

By Chuvilin Andrey in (2004)

Journal of Electron Microscopy,volume 53,issue 3 , Vol. 53, Iss. 3, 2004-06 , pp. 237-244

Oxford University Press

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Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy

By Ishitani Tohru,Sato Mitsugu in (2004)

Journal of Electron Microscopy,volume 53,issue 3 , Vol. 53, Iss. 3, 2004-06 , pp. 245-255

Oxford University Press

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HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis

By Peng Yiping in (2004)

Journal of Electron Microscopy,volume 53,issue 3 , Vol. 53, Iss. 3, 2004-06 , pp. 257-266

Oxford University Press

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Analytical electron microscopy and electron holography on microstructures and magnetic domain structures of Sm-Co 2:17 magnets

By Park Young-Gil,Yang Jun-Mo,Shindo Daisuke in (2004)

Journal of Electron Microscopy,volume 53,issue 3 , Vol. 53, Iss. 3, 2004-06 , pp. 267-270

Oxford University Press

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Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method

By Kawasaki Tadahiro,Taya Masaki,Takai Yoshizo in (2004)

Journal of Electron Microscopy,volume 53,issue 3 , Vol. 53, Iss. 3, 2004-06 , pp. 271-275

Oxford University Press

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Chemical junction delineation of a specific site in Si devices

By Eo Hee-Joo,Yang Jun-Mo,Park Tae-Su,Lee Jong-Pill,Kim Won,Park Ju-Chul,Lee Soun-Young in (2004)

Journal of Electron Microscopy,volume 53,issue 3 , Vol. 53, Iss. 3, 2004-06 , pp. 277-280

Oxford University Press

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Ontogenesis of peripheral electromagnetic receptors in hornets

By Ishay Jacob S. in (2004)

Journal of Electron Microscopy,volume 53,issue 3 , Vol. 53, Iss. 3, 2004-06 , pp. 281-291

Oxford University Press

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