Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10 kV and 40 kV

By Kamino Takeo  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 459-463

Oxford University Press

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Compositional modulation in In x Ga 1−x N: TEM and X-ray studies

By Liliental-Weber Zuzanna  

Journal of Electron Microscopy, Vol. 54, Iss. 3, 2005-06 ,pp. : 243-250

Oxford University Press

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A SAED and HREM study of structural defects in brownmillerite, LaBa x Sr 1‐x CuGaO y related oxides

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Journal of Electron Microscopy, Vol. 51, Iss. 1, 2002-03 ,pp. : 59-66

Oxford University Press

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HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting method

By Tanaka Masaki   Higashida Kenji   Fukui Toru   Yokote Tatsuo  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 505-509

Oxford University Press

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FIB and TEM Observations of Defects in Hot-Dip Zinc Coatings

By Hong Moon-Hi  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 545-552

Oxford University Press

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