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Editorial

By Saka Hiroyasu in (2004)

Oxford University Press

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Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction

By Ishitani Tohru in (2004)

Oxford University Press

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Reducing focused ion beam damage to transmission electron microscopy samples

By Kato Naoko I. in (2004)

Oxford University Press

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Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10 kV and 40 kV

By Kamino Takeo in (2004)

Oxford University Press

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Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis

By Tsuji Satoshi in (2004)

Oxford University Press

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A study of the damage on FIB-prepared TEM samples of Al x Ga 1−x As

By Yabuuchi Yasufumi in (2004)

Oxford University Press

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A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy

By Fukuda Muneyuki in (2004)

Oxford University Press

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Transmission electron microscopy on thin film of high density magnetic composite prepared by FIB method

By Kobayashi Yuko in (2004)

Oxford University Press

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Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system

By Wang Zhouguang,Kato Takeharu,Hirayama Tsukasa in (2004)

Oxford University Press

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Post-thinning technique for a lifted-out membrane

By Sadayama Shoji,Sugiyama Yasuhiko,Iwasaki Koji,Yasaka Anto in (2004)

Oxford University Press

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