Author: Zhan Jinhua Bando Yoshio Hu Junqing Golberg Dmitri
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.54, Iss.6, 2005-12, pp. : 485-491
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Microstructure of Mn-doped, spin-cast FeSi 2
By Morimura T.
Journal of Electron Microscopy, Vol. 46, Iss. 3, 1997-01 ,pp. :
HREM study of ion implantation in 6H-SiC at high temperatures
Journal of Electron Microscopy, Vol. 46, Iss. 4, 1997-01 ,pp. :
The structure of Si nanocrystals on SiC
By Kaiser U.
Journal of Electron Microscopy, Vol. 50, Iss. 4, 2001-08 ,pp. :