Automated characterization of bending and expansion of a lattice of a Si substrate near a SiGe/Si interface by using split HOLZ line patterns

By Saitoh Koh   Yasuda Yoshifumi   Hamabe Maiko   Tanaka Nobuo  

Journal of Electron Microscopy, Vol. 59, Iss. 5, 2010-10 ,pp. : 367-378

Oxford University Press

Access to resources Recommend Favorite

The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination

By Chuvilin Andrey  

Journal of Electron Microscopy, Vol. 53, Iss. 3, 2004-06 ,pp. : 237-244

Oxford University Press

Access to resources Recommend Favorite

Quantitative and easy estimation of a crystal bending effect using low-order CBED patterns

By Yamazaki Takashi   Kashiwagi Akihiro   Kuramochi Koji   Ohtsuka Masahiro   Hashimoto Iwao   Watanabe Kazuto  

Journal of Electron Microscopy, Vol. 57, Iss. 6, 2008-12 ,pp. : 181-187

Oxford University Press

Access to resources Recommend Favorite

Multislice simulation of transmission electron microscopy imaging of helium bubbles in Fe

By Yao Bo   Edwards Danny J.   Kurtz Richard J.   Odette G. Robert   Yamamoto Takuya  

Journal of Electron Microscopy, Vol. 61, Iss. 6, 2012-12 ,pp. : 393-400

Oxford University Press

Access to resources Recommend Favorite

The influence of inclined surfaces on HOLZ reflections

By Spellward P.  

Journal of Electron Microscopy, Vol. 46, Iss. 2, 1997-01 ,pp. : 109-117

Oxford University Press

Access to resources Recommend Favorite