Quantitative and easy estimation of a crystal bending effect using low-order CBED patterns

By Yamazaki Takashi   Kashiwagi Akihiro   Kuramochi Koji   Ohtsuka Masahiro   Hashimoto Iwao   Watanabe Kazuto  

Journal of Electron Microscopy, Vol. 57, Iss. 6, 2008-12 ,pp. : 181-187

Oxford University Press

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On the origin of HOLZ lines splitting near interfaces: multislice simulation of CBED patterns

By Chuvilin Andrey   Kaiser Ute   de Robillard Quentin   Engelmann Hans-Jürgen  

Journal of Electron Microscopy, Vol. 54, Iss. 6, 2005-12 ,pp. : 515-517

Oxford University Press

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Practical considerations on the determination of the accuracy of the lattice parameters measurements from digital recorded diffractograms

By Biskupek Johannes   Kaiser Ute  

Journal of Electron Microscopy, Vol. 53, Iss. 6, 2004-12 ,pp. : 601-610

Oxford University Press

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Local lattice parameter determination of a silicon (001) layer grown on a sapphire (11¯02) substrate using convergent-beam electron diffraction

By Akaogi Takayuki   Tsuda Kenji   Terauchi Masami   Tanaka Michiyoshi  

Journal of Electron Microscopy, Vol. 55, Iss. 3, 2006-06 ,pp. : 129-135

Oxford University Press

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Lattice parameter determination of a composition controlled Si 1−x Ge x layer on a Si (001) substrate using convergent-beam electron diffraction

By Akaogi Takayuki   Tsuda Kenji   Terauchi Masami   Tanaka Michiyoshi  

Journal of Electron Microscopy, Vol. 53, Iss. 6, 2004-12 ,pp. : 593-600

Oxford University Press

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