Quantitative Evaluations of a High-Voltage Multiscan CCDCamera

Author: Kim Young-Min   Lee Jeong Yong   Moonen Daniel   Jang Kang-Il   Kim Youn-Joong  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.56, Iss.6, 2007-12, pp. : 217-224

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Abstract