Computer-assisted simulation of high-voltage electron microscopy using serial images recorded by conventional transmission electron microscopy

Author： Pascher R.   Berthold2 C-H.   Rydmark1 2- M.  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.51, Iss.2, 2002-04, pp. : 113-126

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