The development and characteristics of a high-speed EELS mapping system for a dedicated STEM

Author： Isakozawa Shigeto   Kaji Kazutoshi   Jarausch Konrad   Terada Shohei   Baba Norio  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.57, Iss.2, 2008-04, pp. : 41-45

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