Characterization of polymer–adhesive interfaces on a nanometre scale by elemental mapping and image EELS using EFTEM

By Horiuchi S.  

Journal of Electron Microscopy, Vol. 52, Iss. 3, 2003-06 ,pp. : 255-266

Oxford University Press

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Time-resolved acquisition technique for spatially-resolved electron energy-loss spectroscopy by energy-filtering TEM

By Terada S.   Aoyama1 T.   Yano2 F.   Mitsui2 Y.  

Journal of Electron Microscopy, Vol. 51, Iss. 5, 2002-10 ,pp. : 291-296

Oxford University Press

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Spatially-resolved EELS analysis of multilayer using EFTEM and STEM

By Kimoto K.  

Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 523-528

Oxford University Press

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Elemental mapping of DNA chains by energy-filtering TEM

By Aoyama K.  

Journal of Electron Microscopy, Vol. 52, Iss. 3, 2003-06 ,pp. : 283-289

Oxford University Press

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High Resolution X-Ray Elemental Mapping Using 300-kV Field-Emission TEM

By Murakoshi Hisaya   Kakibayashi Hiroshi   Tsuchiya Tomonobu  

Journal of Electron Microscopy, Vol. 45, Iss. 3, 1996-06 ,pp. : 236-238

Oxford University Press

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