Slow-Scan CCD Camera Analysis of Electron Diffraction and High-Resolution Micrographs of Zeolite TPA/ZSM-5

By Ohnishi Naoyuki   Hiraga Kenji  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 85-92

Oxford University Press

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Structure analysis of inorganic crystals by energy-filtered precession electron diffraction

By Kim Jin-Gyu   Song Kyung   Kwon Kihyun   Hong Kimin   Kim Youn-Joong  

Journal of Electron Microscopy, Vol. 59, Iss. 4, 2010-08 ,pp. : 273-283

Oxford University Press

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Energy‐filtered electron diffraction and high‐resolution electron microscopy on short‐range ordered structure in GaAs 0.5 Sb 0.5

By Shindo* Daisuke   Ikematsu1 Yoichi   Lee Chang‐Woo   Suzuki2 Tohru   Ichihashi3 Toshinari  

Journal of Electron Microscopy, Vol. 51, Iss. 1, 2002-03 ,pp. : 29-34

Oxford University Press

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Short-Range Ordered Structure of Ga 0.47 In 0.53 As Studied by Energy-Filtered Electron Diffraction and HREM

By Shindo Daisuke   Gomyo Akiko   Zuo Jianm-Min   Spence John C. H.  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 99-104

Oxford University Press

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First application of Cc -corrected imaging for high-resolution and energy-filtered TEM

By Kabius Bernd   Hartel Peter   Haider Maximilian   Mller Heiko   Uhlemann Stephan   Loebau Ulrich   Zach Joachim   Rose Harald  

Journal of Electron Microscopy, Vol. 58, Iss. 3, 2009-06 ,pp. : 147-155

Oxford University Press

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