Energy‐filtered electron diffraction and high‐resolution electron microscopy on short‐range ordered structure in GaAs 0.5 Sb 0.5

Author: Shindo* Daisuke   Ikematsu1 Yoichi   Lee Chang‐Woo   Suzuki2 Tohru   Ichihashi3 Toshinari  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.51, Iss.1, 2002-03, pp. : 29-34

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