Performances of an 80200 kV microscope employing a cold-FEG and an aberration-corrected objective lens

Author: Ricolleau Christian   Nelayah Jaysen   Oikawa Tetsuo   Kohno Yuji   Braidy Nadi   Wang Guillaulle   Hue Florian   Florea Lenuta   Pierron Bohnes Vronique   Alloyeau Damien  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.62, Iss.2, 2013-04, pp. : 283-293

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