High-resolution three-dimensional scanning transmission electron microscopy characterization of oxidenitrideoxide layer interfaces in Si-based semiconductors using computed tomography

By Sadayama Shoji   Sekiguchi Hiromi   Bright Alexander   Suzuki Naohisa   Yamada Kazuhiro   Kaneko Kenji  

Journal of Electron Microscopy, Vol. 60, Iss. 3, 2011-06 ,pp. : 243-251

Oxford University Press

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In situ high temperature TEM observation of interaction between multi-walled carbon nanotube and in situ deposited gold nano-particles

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Journal of Electron Microscopy, Vol. 54, Iss. 5, 2005-10 ,pp. : 461-465

Oxford University Press

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In situ electrical measurements and manipulation of B/N-doped C nanotubes in a high-resolution transmission electron microscope

By Golberg* D.   Mitome M.   Kurashima K.   Bando Y.  

Journal of Electron Microscopy, Vol. 52, Iss. 2, 2003-05 ,pp. : 111-117

Oxford University Press

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Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images

By Nomaguchi Tsunenori   Kawasaki Tadahiro   Kimura Yoshihide   Takai Yoshizo  

Journal of Electron Microscopy, Vol. 53, Iss. 4, 2004-08 ,pp. : 403-406

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Transmission electron microscopic observation of cells cultured on multiwalled carbon nanotube-coated sponges

By Hirata Eri   Sakaguchi Norihito   Uo Motohiro   Ushijima Natsumi   Nodasaka Yoshinobu   Watari Fumio   Ichinose Hideki   Yokoyama Atsuro  

Journal of Electron Microscopy, Vol. 59, Iss. 5, 2010-10 ,pp. : 447-450

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