Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope

By Zhang Hai-Bo   Wang Fang   Takaoka Akio  

Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 51-55

Oxford University Press

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Influence of the image quality deterioration of a tilted thick specimen on electron tomography

By Zhang Hai-Bo  

Journal of Electron Microscopy, Vol. 53, Iss. 6, 2004-12 ,pp. : 617-621

Oxford University Press

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Removing focused ion-beam damages on transmission electron microscopy specimens by using a plasma cleaner

By Hata Satoshi   Sosiati Harini   Kuwano Noriyuki   Itakura Masaru   Nakano Takayoshi   Umakoshi Yukichi  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 23-26

Oxford University Press

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A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy

By Fukuda Muneyuki  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 479-483

Oxford University Press

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Cross-sectional image obtained from spherical aberration-free three-dimensional image intensity distribution in transmission electron microscopy

By Taya Masaki   Kawasaki Tadahiro   Takai Yoshizo  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 27-30

Oxford University Press

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