Nondestructive Determination of Tritium Content of Erbium Tritide Thin Films

By Pearson John E.  

Applied Spectroscopy, Vol. 28, Iss. 4, 1974-07 ,pp. : 358-361

Society for Applied Spectroscopy

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X-ray Microanalysis of Precious Metal Thin Films: Thickness and Composition Determination

By Giurlani Walter   Innocenti Massimo   Lavacchi Alessandro  

Coatings, Vol. 8, Iss. 2, 2018-02 ,pp. : 84-84

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X-Ray Fluorescence Determination of Composition and Thickness of Nickel–Iron–Cobalt Thin Films: Application of Solution Techniques

By Cocozza E. P.   Ferguson A.  

Applied Spectroscopy, Vol. 21, Iss. 5, 1967-09 ,pp. : 286-290

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Determination of Temperature and Composition of Phosphosilicate Glass Thin Films from Infrared Emission Spectral Data

By Wangmaneerat B.   Niemczyk T. M.   Haaland D. M.  

Applied Spectroscopy, Vol. 46, Iss. 10, 1992-10 ,pp. : 1447-1453

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Compositional Determination of Sputtered Tantalum–Aluminum Thin Films

By Nohe James D.   Green David A.  

Applied Spectroscopy, Vol. 25, Iss. 4, 1971-07 ,pp. : 489-493

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