Quantitative Infrared Emission Spectroscopy of Phosphosilicate Glass on Silicon Wafers Using Multivariate Calibration

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Applied Spectroscopy, Vol. 46, Iss. 2, 1992-02 ,pp. : 340-344

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Quantitative Determination of Borophosphosilicate Glass Thin-Film Properties Using Infrared Emission Spectroscopy

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Applied Spectroscopy, Vol. 53, Iss. 7, 1999-07 ,pp. : 822-828

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Optical Constant Determination of Thin Polymer Films in the Infrared

By Graf R. T.   Koenig J. L.   Ishida H.  

Applied Spectroscopy, Vol. 39, Iss. 3, 1985-05 ,pp. : 405-408

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Application of Band-Target Entropy Minimization to Infrared Emission Spectroscopy and the Reconstruction of Pure Component Emissivities from Thin Films and Liquid Samples

By Cheng Shuying   Rajarathnam D.   Meiling Tan   Garland Marc  

Applied Spectroscopy, Vol. 60, Iss. 5, 2006-05 ,pp. : 521-528

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Nondestructive Determination of the Composition of High-T_c Superconducting Thin Films

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