In Situ Evaluation of Diffusion Mechanisms in Thin Polystyrene Films Used as Integrated Optical Structures

Author: Fell Nicholas F.   Bohn Paul W.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.45, Iss.7, 1991-08, pp. : 1085-1092

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Abstract