In Situ Identification of Thin-Layer Chromatography Fractions by FT Raman Spectroscopy

Author： Everall Neil J. Chalmers John M. Newton Ian D.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.46, Iss.4, 1992-04, pp. : 597-601

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Raman Spectroscopy for the in Situ Identification of Cocaine and Selected Adulterants

By Carter J. Chance Brewer William E. Angel S. Michael

Applied Spectroscopy, Vol. 54, Iss. 12, 2000-12 ,pp. : 1876-1881

Society for Applied Spectroscopy

Access to resources Recommend Favorite

In Situ Analysis in Geological Thin-Sections by Laser Raman Microprobe Spectroscopy: A Cautionary Note

By Pasteris Jill Dill

Applied Spectroscopy, Vol. 43, Iss. 3, 1989-03 ,pp. : 567-570

Society for Applied Spectroscopy

Access to resources Recommend Favorite

Microchannel Thin Layer Chromatography with in Situ Plate Scanning Micro-DRIFTS Detection Using Plain and Polybutadiene Modified Zirconia Stationary Phases

By Musial Beata A. Sommer André J. Danielson Neil D.

Applied Spectroscopy, Vol. 56, Iss. 8, 2002-08 ,pp. : 1059-1066

Society for Applied Spectroscopy

Access to resources Recommend Favorite

In Situ Studies of Coatings on Metal Wires by FT-IR External Reflectance Spectroscopy

By Xue Gi Liu Shi-Ying Jin Yi Jiang Shan-Geng

Applied Spectroscopy, Vol. 41, Iss. 7, 1987-09 ,pp. : 1172-1175

Society for Applied Spectroscopy

Access to resources Recommend Favorite

In Situ FT-IR Spectroscopy of the Adsorption of CO on Methanol Catalysts

By Edwards J. F. Schrader G. L.

Applied Spectroscopy, Vol. 35, Iss. 6, 1981-11 ,pp. : 559-563

Society for Applied Spectroscopy

Access to resources Recommend Favorite