Depth Profiling of Stratified Layers Using Variable-Angle ATR

By Shick Robert A.   Koenig Jack L.   Ishida Hatsuo  

Applied Spectroscopy, Vol. 50, Iss. 8, 1996-08 ,pp. : 1082-1088

Society for Applied Spectroscopy

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New Optical Depth-Profiling Technique by Use of the Multiple-Frequency Approach with Single ATR FT-IR Spectrum: Theoretical Development

By Ekgasit Sanong   Ishida Hatsuo  

Applied Spectroscopy, Vol. 51, Iss. 10, 1997-10 ,pp. : 1488-1495

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Concurrent Determination of Optical Constants and the Kramers-Kronig Integration Constant (Anchor Point) Using Variable-Angle ATR/FT-IR Spectroscopy

By Tickanen Lane D.   Tejedor-Tejedor M. Isabel   Anderson Marc A.  

Applied Spectroscopy, Vol. 46, Iss. 12, 1992-12 ,pp. : 1848-1858

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Depth Profile of Pyrene Dopant in Polymer Films by Variable-Angle Total Internal Reflection Fluorescence Spectroscopy

By Yanagimachi Masatoshi   Toriumi Minoru   Masuhara Hiroshi  

Applied Spectroscopy, Vol. 46, Iss. 5, 1992-05 ,pp. : 832-840

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Novel Approach to Quantitative Depth Profiling of Surfaces Using ATR/FT-IR Measurements

By Huang Jiangbing   Urban Marek W.  

Applied Spectroscopy, Vol. 47, Iss. 7, 1993-07 ,pp. : 973-981

Society for Applied Spectroscopy

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