New Optical Depth-Profiling Technique by Use of the Multiple-Frequency Approach with Single ATR FT-IR Spectrum: Theoretical Development

Author： Ekgasit Sanong Ishida Hatsuo

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.51, Iss.10, 1997-10, pp. : 1488-1495

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